Method for characterizing cells with consideration for bumped waveform and delay time calculation method for semiconductor integrated circuits using the same

摘要

An effective input terminal capacitance which is effectively equivalent to a cell in which a waveform distortion is caused due to the Miller effect and a drive load connected to the cell is calculated in advance, and the cell and the drive load are replaced by the calculated effective input terminal capacitance, while considering that the Miller effect is caused according to the size of the drive load driven by a delay time calculation subject circuit, such as a cell, or the like, and a distortion occurs in input and output waveforms of the delay time calculation subject circuit due to the Miller effect. Thereafter, a circuit simulation is carried out using the effective input terminal capacitance. A resultant effective input terminal capacitance value is characterized as a function of an input slope waveform and the drive load and converted to table data.