发明名称 SYSTEM AND METHOD FOR DIAGNOSING FAILURE USING IC TAG
摘要 <P>PROBLEM TO BE SOLVED: To specify a unit in which a failure is generated and to present a failure analysis result by independently collecting failure information per unit of a system to be maintained without operating the system to be maintained regarding a system and a method for diagnosing the failure using an IC tag which diagnoses the failure of a unit constituting the system. <P>SOLUTION: The system for diagnosing the failure comprises provided with the IC tag attached by associating it with the unit or a plurality of units constituting the system and a writing part which writes failure information collected from the unit or the plurality of units in the IC tag. Pieces of failure information about the unit or the plurality of units are read from the IC tag. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005293345(A) 申请公布日期 2005.10.20
申请号 JP20040108889 申请日期 2004.04.01
申请人 FUJITSU SUPPORT & SERVICE KK 发明人 HISAYUKI JIRO
分类号 B42D15/10;G06F11/34;G06K17/00 主分类号 B42D15/10
代理机构 代理人
主权项
地址