| 摘要 |
PROBLEM TO BE SOLVED: To provide a method which enables measurement of duty cycle in signal, without requiring dedicated analog instruments. SOLUTION: This measuring method is sufficiently speedy, to allow measurement of duty cycle in a semiconductor component during manufacture. This method also can be provided at low cost, by using an automatic test equipment. A comparator of digital channels is used to read the input signal status at plural points throughout the signal cycle. A failure processing circuit in the testing unit is used to count the number of samples, wherein input signal is in a logic HI state. This value is scaled by the total number of samples collected for providing one number which indicates the duty cycle of the signal. COPYRIGHT: (C)2006,JPO&NCIPI
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