发明名称 Photo mask and method for controlling the same
摘要 In a photo mask to transfer a mask pattern to a substrate by irradiating ultraviolet rays in a mask-pattern-forming region, an evaluation pattern having depressions in which a growable substance of the same kind as that of a foreign substance growing in the mask-pattern-forming region by ultraviolet rays on at least any one surface out of a mask-pattern-forming surface and the back surface thereof. And, the usage limit of the photo mask is evaluated according to a degree of cloudiness of the respective depressions, for instance, by irradiating the evaluation pattern with a high intensity light source.
申请公布号 US2005233225(A1) 申请公布日期 2005.10.20
申请号 US20040994636 申请日期 2004.11.23
申请人 FUJITSU LIMITED 发明人 IBARAGI TOSHIAKI
分类号 G03F1/08;G03C5/00;G03F1/14;G03F1/38;G03F1/50;G03F9/00;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/08
代理机构 代理人
主权项
地址