Error testing system for integrated circuit incorporates high-frequency generator connected to amplifier connected via transmission circuit to test circuit examined by emission microscope

摘要

The integrated circuit under test (DUT-IC) is mounted on a DPI test circuit (DPI-Test-Platine). The test circuit is connected to a function test circuit (Funktions-bewertung.....). A video camera or emission microscope (Bildverarbeitung.....) is used to examine the circuit under test. The video camera is connected to a function block (Funktionsblock). The circuit under test is excited by a high-frequency oscillator (HF-Generator) connected to an amplifier (Verstarker) connected via a transmission circuit (Richtkoppler) to the test circuit. A high-frequency load measuring circuit (HF-Leistungs-Messgerat) receives signals from the transmission circuit.