| 摘要 |
Disclosed is a semiconductor integrated circuit device using a scan path test in which propagation of an indefinite value to a test target path is inhibited while suppressing an increase in a circuit area, and a test method thereof. When a plurality of flip-flops within a logic circuit is serially connected to form scan chains and a scan path test is conducted, one or a plurality of flip-flops within the logic circuit are provided as indefinite state control flip-flops for holding values for preventing an indefinite value from propagating through a test target path and being captured by the scan chain on an output side during the test. The indefinite state control flip-flops are serially connected based on a control signal, and constitute a chain of flip-flops, different from the scan chain of other flip-flops. A value serially input from an input terminal is set in the plurality of indefinite state control flip-flops, respectively.
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