发明名称 |
ABSOLUTE REFRACTIVE INDEX MEASURING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To overcome the problem in an absolute refractive index measuring device for measuring absolute refractive index of gas with high accuracy by using a Michelson interferometer, that absolute refractive index of liquid can not be measured by this absolute refractive index measuring device as an area for filling a sample gas is mounted on a horizontal face same as the other members in the absolute refractive index measuring device, it is impossible to fill the sample liquid only in the area for filling the sample gas. SOLUTION: This absolute refractive index measuring device is provided with a light guide means for changing the direction of the laser beam into the vertical direction to easily measure the absolute refractive index of the liquid, and a moving stage and a fixed stage respectively mounted on horizontal faces different from each other at a lower part of the light guide means. By applying this arrangement, the sample liquid can be filled only between the moving stage and the fixed stage regardless of the positional relationship of upper components with respect to the fixed stage or the moving stage. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005292032(A) |
申请公布日期 |
2005.10.20 |
申请号 |
JP20040110065 |
申请日期 |
2004.04.02 |
申请人 |
KYOTO ELECTRON MFG CO LTD;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
KOBAYASHI YOSHIYASU;MATSUOKA TAKESHI;FUJII KENICHI;KAYUKAWA YOHEI |
分类号 |
G01N21/45;(IPC1-7):G01N21/45 |
主分类号 |
G01N21/45 |
代理机构 |
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