| 摘要 |
PROBLEM TO BE SOLVED: To acquire a partial projection image of high resolution only in a specified portion together with the whole projection image of an inspected object, in a relatively short time, to facilitate composition processing for the projection images acquired from two detectors, and to cope with both a nonmetal (including light metal) and heavy metal inspected objects. SOLUTION: The two detectors 20, 40 different in characteristics are mounted on one X-ray imaging device, projection data are acquired alternately while making the best use of respective features thereof, the resolution of a reconstituted image is enhanced thereby in the specified portion of the inspected object 10, and a driving mechanism is provided to use only the detector 40 having an incident window capable of transmitting even a soft ray, out of the two kinds of detectors 20, 40, in the case of the inspected object 10 comprising only the light element, and to select the detector 20 having a wide detection area but having coarse picture elements, for example, in the case of the inspected object 10 mixed with the heavy metal having 10 mm of diameter. COPYRIGHT: (C)2006,JPO&NCIPI
|
