发明名称 Semiconductor memory device including fuse element
摘要 A semiconductor device includes a semiconductor substrate, an insulating layer formed on the semiconductor substrate, input-output terminals, and a fuse block. A plurality of memory macros each having a plurality of memory cells is arranged on the semiconductor substrate. The insulating layer, which has a window portion, may be formed on the semiconductor substrate and covering the memory macros, the insulating layer having a window portion. The input-output terminals are arranged inline along an edge portion of the surface of the insulating layer. The input-output terminals transmit and receive signals between the memory macros and a circuit external to the semiconductor device. The fuse block is arranged in a space corresponding to the window portion in the insulating layer. The fuse block may include a plurality of fuse elements used to remedy defective portions of the plurality of memory cells in the plurality of memory macros.
申请公布号 US6956783(B2) 申请公布日期 2005.10.18
申请号 US20020166594 申请日期 2002.06.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IKUTA HIROAKI;TOMIOKA KAZUHIKO
分类号 G11C11/401;G11C29/00;H01L21/82;H01L21/8242;H01L23/525;H01L27/108;(IPC1-7):G11C7/00 主分类号 G11C11/401
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