发明名称 Comparison of chemical-mechanical polishing processes
摘要 Chemical-mechanical polishing ("CMP") processes performed on bodies ( 10 ), each having areas ( 16 and 18 ) of different depression pattern densities, are compared by correlating polishing data accumulated, for one such body, on an area ( 16 ) of one pattern density to polishing data accumulated, for that body, on an area of another pattern density for each of the CMP processes.
申请公布号 US6955987(B2) 申请公布日期 2005.10.18
申请号 US20020309473 申请日期 2002.12.03
申请人 MOSEL VITELIC, INC. 发明人 WU KUO-CHUN
分类号 B24B37/04;B24B49/03;H01L21/00;H01L21/3105;H01L21/321;(IPC1-7):H01L21/302 主分类号 B24B37/04
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