| 摘要 |
PROBLEM TO BE SOLVED: To reduce the cost of a semiconductor testing device, by simplifying data control when a lot of data is transmitted by using two or more serial transmission devices. SOLUTION: In the semiconductor testing device, transmission control units 2<SB>1</SB>, 2<SB>2</SB>, receive control units 5<SB>1</SB>, 5<SB>2</SB>constitute a data transfer device. A transmission path control line 14 generated from the receive control unit 5<SB>1</SB>is concentrated to the receive control unit 5<SB>2</SB>as a master receive control unit and turned, along with a result of self control unit at the response signal transmission control circuit 12<SB>2</SB>of the receive control unit 5<SB>2</SB>, to the master control unit 2<SB>2</SB>on the transmission side through a two way response control signal line 6. From a response signal receive control circuit 9<SB>2</SB>on the transmission side, it is distributed to two or more control units on the transmission side by using a transfer path control line 15. COPYRIGHT: (C)2006,JPO&NCIPI |
