发明名称 |
Systems and methods for processing automatically generated test patterns |
摘要 |
Representative embodiments are generally directed to storing compressed test pattern data on an automated test equipment (ATE) device. In one embodiment, the test pattern data is compressed according to a linear feedback shift register (LFSR). The LFSR may possess a low probability of occurrence of linear dependencies associated with compression of stimulus patterns to enable relatively highly compacted patterns to be compressed. Additionally or alternatively, repeat-filled test pattern data is run length encoded using variable length code words to facilitate parallel decompression within the ATE device.
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申请公布号 |
US2005229062(A1) |
申请公布日期 |
2005.10.13 |
申请号 |
US20040818101 |
申请日期 |
2004.04.05 |
申请人 |
VOLKERINK ERIK H;HILLIGES KLAUS-DIETER |
发明人 |
VOLKERINK ERIK H.;HILLIGES KLAUS-DIETER |
分类号 |
G01R31/3181;G01R31/3183;G01R31/319;(IPC1-7):G06F19/00;G01R27/28;G01R31/00;G01R31/14;G01R31/28;G06F11/00 |
主分类号 |
G01R31/3181 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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