| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray imaging method capable of attaining X-ray imaging with high accuracy without the need for employing pixels whose areas are miniaturized. SOLUTION: The X-ray imaging method includes: a first imaging step of using an X-ray image sensor 1 comprising an FPD (flat panel detector) of a semiconductor imaging element to carry out first imaging; and a second imaging step of using laminated piezoelectric elements 2, 3 to minutely move the X-ray image sensor 1 to a pixel interpolation position in the X axis direction and/or in the Y axis direction after the first imaging and using the X-ray image sensor 1 to carry out second imaging. COPYRIGHT: (C)2006,JPO&NCIPI
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