发明名称 Micro thermal chamber having proximity control temperature management for devices under test
摘要 A temperature unit to control a temperature of a device under test using a fluid includes a block disposed opposite the device under test and which defines a gap therebetween and through which the fluid passes across the device under test at a gap flow rate, and an actuator which moves the block. By adjusting the gap, the gap flow rate of the fluid flowing over the device under test changes so as to adjust the temperature of the device under test. Additionally, the block can be a heater block which generates heat receivable by the device under test across the gap such that the adjustment of the heater block by the actuator changes a thermal resistance across the gap.
申请公布号 US2005224492(A1) 申请公布日期 2005.10.13
申请号 US20040822841 申请日期 2004.04.13
申请人 ADVANTEST CORPORATION 发明人 ROY SHAMBHU N.
分类号 G01R31/28;G01R31/319;(IPC1-7):H05B1/02 主分类号 G01R31/28
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