Scanning microscope for investigating and manipulating a sample comprises a first beam deflection device deflecting a first illuminating light beam and a second illuminating light beam

摘要

Scanning microscope comprises a beam deflection device (1) that deflects a first illuminating light beam (5) to scan a sample (13), and a second beam deflection device (33) that deflects a second illuminating light beam (37). The first and the second beam deflection device deflect the second illuminating light beam. An independent claim is also included for a module comprising a second beam deflection device for coupling to a scanning microscope with a first beam deflection device. Preferred Features: The first and the second beam deflection devices are synchronized with each other.