发明名称 Fast-test printed resistor device with test auxiliary lines
摘要 A fast-test printed resistor device with test auxiliary lines on a printed circuit substrate is disclosed. The resistor device comprises at least one first printed circuit foil; at least one second printed circuit foil; a first carbon film resistor sheet connected to the at least one first printed circuit foil; a second carbon film resistor sheet connected to the at least one second printed circuit foil; a first test auxiliary line connected to the first carbon film resistor sheet; and a second test auxiliary line connected to the carbon film resistor sheet; a gap being formed between the first and second test auxiliary lines. One end of each of the two test auxiliary lines is connected to an edge of a respect one of the two carbon film resistor sheets and another end of the test auxiliary line is extended out with a predetermined length for testing.
申请公布号 US2005225423(A1) 申请公布日期 2005.10.13
申请号 US20040822292 申请日期 2004.04.12
申请人 HSU WEI 发明人 HSU WEI
分类号 G01L1/22;G01R31/28;H01C17/065;H05K1/02;H05K1/16;(IPC1-7):G01L1/22 主分类号 G01L1/22
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