发明名称 Mask ROM and the method of forming the same and the scheme of reading the device
摘要 The structure of the nonvolatile memory comprises a substrate having source/drain formed at unselected sides and source/drain with extension source/drain formed at other selected sides. A gate dielectric layer is formed on the substrate and a gate is formed on the gate dielectric layer. An isolation layer is formed along the surface of the gate. Spacers are formed attached on the sidewalls of the gate.
申请公布号 US2005227420(A1) 申请公布日期 2005.10.13
申请号 US20050134949 申请日期 2005.05.23
申请人 APPLIED INTELLECTUAL PROPERTIES CO., LTD. 发明人 JENG ERIK S.
分类号 H01L21/265;H01L21/28;H01L21/336;H01L21/8246;H01L27/112;H01L29/51;H01L29/78;(IPC1-7):H01L21/00;H01L21/84;H01L21/823 主分类号 H01L21/265
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