| 摘要 |
PROBLEM TO BE SOLVED: To give arbitrary input test voltage to an internal circuit not by using an ordinary input terminal but by using an ESD protection circuit, and to perform test in a wafer state even if this semiconductor device is mounted with an internal circuit for processing high speed signals like an AD converter and a high-speed signal IF, etc. SOLUTION: In a test mode, an input test voltage control voltage Vcont is given from an input test voltage control terminal 19 to a control circuit 17. The control circuit 17 controls the ESD protection circuit 16 so that an arbitrary input test voltage Vtest corresponding to the control voltage Vcont is given from the protection circuit 16 to the internal circuit 14. COPYRIGHT: (C)2006,JPO&NCIPI
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