发明名称 [NON-VOLATILE MEMORY STRUCTURE AND MANUFACTURING METHOD THEREOF]
摘要 A non-volatile memory including a substrate, a plurality of gate structures, a plurality of select gate structures, spacers and source region/drain region is provided. Each gate structure on the substrate further includes a bottom dielectric layer, an electron trapping layer, an upper dielectric layer, a control gate and a cap layer. The select gate structures are disposed on one side of the respective each gate structure. Each select gate structure includes a select gate dielectric layer and a select gate. The select gate structures and the gate structures are connected in series to form a memory cell row. The spacers are disposed between the select gate structures and the gate structures. The source region and the drain region are disposed in the substrate on each side of the memory cell row.
申请公布号 US2005224858(A1) 申请公布日期 2005.10.13
申请号 US20040710671 申请日期 2004.07.28
申请人 HUNG CHIH-WEI;HSU CHENG-YUAN 发明人 HUNG CHIH-WEI;HSU CHENG-YUAN
分类号 G11C11/34;H01L21/8247;H01L27/115;(IPC1-7):G11C11/34 主分类号 G11C11/34
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