发明名称 High voltage semiconductor device utilizing a deep trench structure
摘要 A semiconductor device includes a substrate having a source, a drain, and a gate between the source and the drain. Both the source and the drain include a first edge, and the gate includes a first portion. A first deep trench structure is situated under the first portion of the gate and proximate to the first edge of the source and the first edge of the drain.
申请公布号 US2005224896(A1) 申请公布日期 2005.10.13
申请号 US20040821432 申请日期 2004.04.09
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO. LTD. 发明人 WU CHEN-BAU;HSU SHUN-LIANG;WU YOU-KUO;JONG YU-CHANG
分类号 H01L21/28;H01L29/06;H01L29/45;H01L29/49;H01L29/51;H01L29/76;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/28
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