发明名称 |
An on-chip and at-speed tester for testing and characterization of different types of memories |
摘要 |
<p>An on-chip and at-speed testerfor testing and characterization of different types of memories in an integrated circuit device, comprising a Centralized Flow Controller for automatically controlling the test operations for selected test programs, and Localised Signal Generators located inside each memory block and controlled by said Centralized Flow Controlle for applying specified test patterns on the associated memory array. <IMAGE></p> |
申请公布号 |
EP1585139(A1) |
申请公布日期 |
2005.10.12 |
申请号 |
EP20050102753 |
申请日期 |
2005.04.07 |
申请人 |
STMICROELECTRONICS PVT. LTD |
发明人 |
BAHL, SWAPNIL;SINGH, BALWANT |
分类号 |
G01R31/317;G01R31/3187;G11C29/00;G11C29/12;G11C29/16;(IPC1-7):G11C29/00;G01R31/318 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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