| 摘要 |
<p>The invention relates to an analysis model producing/assisting apparatus (100) that produces a recognition model (503), approximating surfaces of configuration and ridgelines thereof by planes and lines, from a configuration model (501) showing the configuration. Thereafter, it produces a mapping model (504) through dividing the recognition model (503) into cubic grids, and then produces an analysis model (505), through mapping grid points of the mapping model (504) onto the configuration model (501). When producing the recognition model (503), know-how for producing the analysis model (505), which gives an influence upon quality of the meshes of the analysis model (505), is taken out from a database (104), and that know-how for producing the analysis model (505) is applied onto the configuration model (501).</p> |
