发明名称 Process and device for evaluating symbol lengths on a recording medium
摘要 A symbol length is evaluated on the basis of receiving a first-symbol length, and a phase error with respect to detection of a length of the first symbol before receiving a length of a second symbol following the first symbol. The process includes evaluating at least two random phase errors on the basis of the phase error received. A first random phase error is dependent on a deterministic phase error with respect to a first state corresponding to an absence of a corrected first-symbol length. A second random phase error is dependent on a deterministic phase error with respect to a second state corresponding to the corrected first-symbol length. The process includes retaining as an evaluated symbol length the first-symbol length received if the absolute value of the first random phase error reduces a condition of passing through the first state. The second step also retains as an evaluated symbol length the corrected first-symbol length if the absolute value of the second random phase error reduces the condition of passing through the second state.
申请公布号 US6954413(B2) 申请公布日期 2005.10.11
申请号 US20020320757 申请日期 2002.12.16
申请人 STMICROELECTRONICS SA 发明人 GRAFFOULIERE PHILIPPE
分类号 G11B20/10;G11B20/14;G11B20/18;(IPC1-7):G11B7/00 主分类号 G11B20/10
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