IR IN CIRCUIT TEST SYSTEM,申请号KR20020029793-传众专利搜索

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发明名称	IR IN CIRCUIT TEST SYSTEM
摘要
申请公布号	KR100519593(B1)	申请公布日期	2005.10.07
申请号	KR20020029793	申请日期	2002.05.29
申请人		发明人
分类号	G01R31/319;(IPC1-7):G01R31/26	主分类号	G01R31/319
代理机构		代理人
主权项
地址

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