| 摘要 |
PROBLEM TO BE SOLVED: To provide the contact ring of a semiconductor testing device capable of correctly examining an object to be tested. SOLUTION: In the contact ring of the semiconductor testing device which examines objects to be tested, a performance board and a probe card are connected electrically. The contact ring of the semiconductor testing device comprises a plurality of printed circuit boards radially arranged with a test section for examining the objects to be tested. COPYRIGHT: (C)2006,JPO&NCIPI
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