发明名称 VACUUM VAPOR DEPOSITION SYSTEM AND VACUUM VAPOR DEPOSITION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a vapor deposition system in which the influence of the contamination to a vapor deposition film can be reduced based on the finding on a relation between the contamination and the pressure in a chamber in a vapor deposition process. SOLUTION: The phenomenon that the adsorption of organic materials drastically lowers as compared with the case the gaseous pressure in the chamber is maintained in a viscous flow region and the case the pressure is maintained in a molecular flow region is found and based on the phenomenon, the gaseous pressure is so controlled as to be maintained in the molecular flow region at the time of forming the vapor deposited thin film and to be maintained in the viscous flow region at the time of the non-deposition, and thereby the vapor deposited thin film can be formed with the reduced contamination with the organic materials. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005272969(A) 申请公布日期 2005.10.06
申请号 JP20040090481 申请日期 2004.03.25
申请人 OMI TADAHIRO 发明人 OMI TADAHIRO;TERAMOTO AKINOBU
分类号 H05B33/10;C23C14/00;H01L51/50;H05B33/14;(IPC1-7):C23C14/00 主分类号 H05B33/10
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