发明名称 Semiconductor devices having elongated contact plugs and methods of manufacturing the same
摘要 A method of manufacturing a semiconductor device includes forming conductive structures on a substrate. Each of the conductive structures has a line shape that extends along a first direction parallel to the substrate. Insulating spacers are formed on upper sidewalls of the conductive structures. An insulating interlayer is formed that covers the conductive structures. A portion of the insulating interlayer between the conductive structures is etched to form a contact hole. An upper portion of the contact hole is larger than a lower portion thereof. The upper portion of the contact hole has a first width along the first direction and a second width along a second direction parallel to the substrate and substantially perpendicular to the first direction. The first width is substantially larger than the second width. The contact hole is filled with a conductive material to form a contact plug.
申请公布号 US2005218408(A1) 申请公布日期 2005.10.06
申请号 US20050096129 申请日期 2005.03.31
申请人 YUN CHEOL-JU;CHUNG TAE-YOUNG;LEE DONG-JUN 发明人 YUN CHEOL-JU;CHUNG TAE-YOUNG;LEE DONG-JUN
分类号 H01L27/108;H01L21/60;H01L21/768;H01L21/8242;H01L29/12;(IPC1-7):H01L29/12 主分类号 H01L27/108
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