发明名称 Method and system for calibrating deformed instruments
摘要 Certain embodiments of the present invention provide a system and method for calibrating an instrument for an image-guided operation. The method includes placing a plurality of fiducials on an instrument, obtaining a plurality of measurements for the instrument using the plurality of fiducials, determining a representation of the instrument in a reference coordinate system using the plurality of measurements for use in tracking the instrument, and performing an image-guided operation using an image data set and representation of the instrument. The representation may be a closed form registration for the instrument. The measurements for the instrument may be obtained using a plurality of fiducials and a sensor. The fiducials may be indentations and/or grooves in the instrument. In an embodiment, the representation of the instrument is dynamically updated during an image-guided operation. In an embodiment, the representation of the instrument is compared to a computer-generated model of the instrument.
申请公布号 US2005222793(A1) 申请公布日期 2005.10.06
申请号 US20040817652 申请日期 2004.04.02
申请人 LLOYD CHARLES F;GRIMAUD MICHEL;LI ALEX D;LEVINE LEWIS J;LEA JON T 发明人 LLOYD CHARLES F.;GRIMAUD MICHEL;LI ALEX D.;LEVINE LEWIS J.;LEA JON T.
分类号 A61B5/05;A61B19/00;G01C19/00;(IPC1-7):G01C19/00 主分类号 A61B5/05
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