发明名称 METHOD AND APPARATUS FOR IMPROVED PROCESSING WITH A GAS-CLUSTER ION BEAM
摘要 Apparatus and methods for improving processing of workpieces with gas-cluster ion beams and modifying the gas-cluster ion energy distribution in the GCIB. In a reduced-pressure environment, generating an energetic gas-cluster ion beam and subjecting the beam to increased pressure region.
申请公布号 WO2005091990(A2) 申请公布日期 2005.10.06
申请号 WO2005US08983 申请日期 2005.03.18
申请人 EPION CORPORATION;SWENSON, DAVID, R.;HAUTALA, JOHN, J.;GWINN, MATTHEW, C.;MACK, MICHAEL, E.;TABAT, MARTIN, E. 发明人 SWENSON, DAVID, R.;HAUTALA, JOHN, J.;GWINN, MATTHEW, C.;MACK, MICHAEL, E.;TABAT, MARTIN, E.
分类号 H01J27/00;H01J27/02;H01J37/305 主分类号 H01J27/00
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