发明名称 METHOD AND PROGRAM FOR MANIPULATING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide an electron microscope which realizes the automation with a tomography while using an omega type energy filter. SOLUTION: A second deflection coil 16 is arranged at a lower stage of an omega type energy filter 15. This deflection coil 16 generates a predetermined magnetic field in the X direction on the X-Y plane vertical to electron beams to calculate vectors which indicate the moving direction and moving amount for a target object on an image. Similarly, one set of deflection coils generate a predetermined magnetic field on the X-Y plane vertical to the electron beams to calculate vectors which indicate the moving direction and moving amount for the target object on the image. Then, a basic matrix is determined based on the vector calculated by the first vector calculation processing and the vector calculated by the second vector calculation processing. A correction value for correcting positional deviation is calculated based on this basic matrix. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005276759(A) 申请公布日期 2005.10.06
申请号 JP20040092022 申请日期 2004.03.26
申请人 JEOL LTD 发明人 MOTOKI SOUHEI
分类号 H01J37/147;H01J37/26;(IPC1-7):H01J37/147 主分类号 H01J37/147
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