发明名称 |
Jitter testing device for electronic device e.g. deserializer, has determination unit that determines whether electronic device is defective, by detecting bit error in output signal from electronic device |
摘要 |
<p>The device has an application unit (104) with a cable to apply deterministic jitter to an input signal supplied to an electronic device (10). A controller (106) controls a magnitude of the deterministic jitter. A determination unit (108) determines whether the electronic device is defective, by detecting a bit error in an output signal that is output from the electronic device based on the input signal. An independent claim is also included for an electronic device testing method.</p> |
申请公布号 |
DE102004061510(A1) |
申请公布日期 |
2005.10.06 |
申请号 |
DE20041061510 |
申请日期 |
2004.12.16 |
申请人 |
ADVANTEST CORP., TOKIO/TOKYO |
发明人 |
ISHIDA, MASAHIRO;YAMAGUCHI, TAKAHIRO;SOMA, MANI |
分类号 |
G01R31/00;G01R29/02;G01R29/26;G01R31/28;G01R31/30;G01R31/3183;H04B3/46;H04B17/00;H04L1/20;H04L1/24;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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