发明名称 Jitter testing device for electronic device e.g. deserializer, has determination unit that determines whether electronic device is defective, by detecting bit error in output signal from electronic device
摘要 <p>The device has an application unit (104) with a cable to apply deterministic jitter to an input signal supplied to an electronic device (10). A controller (106) controls a magnitude of the deterministic jitter. A determination unit (108) determines whether the electronic device is defective, by detecting a bit error in an output signal that is output from the electronic device based on the input signal. An independent claim is also included for an electronic device testing method.</p>
申请公布号 DE102004061510(A1) 申请公布日期 2005.10.06
申请号 DE20041061510 申请日期 2004.12.16
申请人 ADVANTEST CORP., TOKIO/TOKYO 发明人 ISHIDA, MASAHIRO;YAMAGUCHI, TAKAHIRO;SOMA, MANI
分类号 G01R31/00;G01R29/02;G01R29/26;G01R31/28;G01R31/30;G01R31/3183;H04B3/46;H04B17/00;H04L1/20;H04L1/24;(IPC1-7):G01R31/28 主分类号 G01R31/00
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