| 摘要 |
PROBLEM TO BE SOLVED: To reduce human labor required for maintenance/management, storage space, etc. by giving versatility to a measuring instrument for electronic component measurement, and to cope with the high-density mounting of electronic components by reducing the number of wires for connecting a circuit substrate under measurement to a measuring apparatus. SOLUTION: This inspection device for measuring the electrical characteristics of an electronic component by bringing the electronic component 7 into contact with an electrode 8 for characteristics measurement provided on a substrate 2, comprises an anisotropic electrical conductor 1 for mounting thereon the circuit substrate 7 under measurement, the circuit substrate 2 for connection for mounting thereon the electrical conductor 1, and a cable 3 for connection attached to the circuit substrate 2. Lands 8 acting as probes are uniformly disposed on a substrate surface of the circuit substrate 2. A matrix-like circuit is formed on the circuit substrate 2 out of a plurality of lateral wires 32 parallel arranged on the circuit substrate 2 and a plurality of longitudinal wires 31 orthogonal to the lateral wires 32. An electrical connection to a specific land 8 is selected by selecting a row and a column. COPYRIGHT: (C)2006,JPO&NCIPI
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