发明名称 |
MANUFACTURING METHOD OF HEAT RADIATION PLATE FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide the manufacturing method of a heat radiation plate for a semiconductor device, which does not generate surface roughness of the metal plate caused by an oil layer generated between a first die and the metal plate. SOLUTION: The manufacturing method of the heat radiation plate for the semiconductor device is provided with a burr removing process for performing burr clearance of the metal plate extracted by the first die and a first punch, a metal plate gradient formation process for forming gradient in a first principal surface end face of the metal plate, and a level difference formation process for forming a level difference on the second principal surface of the metal plate. The manufacturing method can prevent the metal plate from the surface roughness caused by the oil layer generated between the first die and the metal plate. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005276985(A) |
申请公布日期 |
2005.10.06 |
申请号 |
JP20040086261 |
申请日期 |
2004.03.24 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
SENOO TOMIO;TANAKA YUTAKA;SANADA HIROSHI;WAKABAYASHI JUNICHI |
分类号 |
H01L23/36;(IPC1-7):H01L23/36 |
主分类号 |
H01L23/36 |
代理机构 |
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