发明名称 SYSTEM AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To improve the controllability of a lithography process of a flexible substrate and to prevent the precise scanning motion of a carriage that supports a pattern generator from being blocked even when a flexible substrate is located in the vicinity of an exposure area of the carriage. <P>SOLUTION: A lighting system that forms radiation beams, a pattern generator that performs patterning of the beams, a projection system that performs patterning of the flexible substrate by projecting the pattern beams to a target part of the flexible substrate, and a motion system that controls the motion of the flexible substrate are provided, and the target part of the flexible substrate remains still almost without extending even during the period of exposure by the pattern beams. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005277419(A) 申请公布日期 2005.10.06
申请号 JP20050082757 申请日期 2005.03.22
申请人 ASML HOLDING NV 发明人 GALBURT DANIEL N;JANIK STANLEY G
分类号 G03F7/20;A61N5/00;H01L21/027;H05K1/00;H05K3/00 主分类号 G03F7/20
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