发明名称 |
NEAR-FIELD OPTICAL MICROSCOPE AND POLARIZATION EVALUATING METHOD USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a new near-field optical microscope capable of observing polarized light from an object to be observed, and to provide a polarization evaluating method using the same. SOLUTION: The near-field optical microscope 1 includes an incident optical system 10 for making polarized light from an illumination light source 11 incident on the object to be observed 2 via a polarization control part 12 and a polarization holding fiber 13; a scanning part stage 3 for mounting and scanning the object to be observed 2; a near-field light detecting optical system 20 for making near-field light from the object to be observed 2 incident on a polarization holding fiber probe 21 and acquiring a near-field light signal 23a by making a photodetector 23 detect the emerging light polarized and held by the polarization-retaining fiber probe 21 via a polarizer 22; and a control system 30 for controlling the scanning part stage 3 and inputting the near-field light signal 23a. A distribution of polarized near-field light from the object to be observed 2 is acquired, on the basis of position data of the scanning part stage 3 and the near-field light signal data 23a. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005274460(A) |
申请公布日期 |
2005.10.06 |
申请号 |
JP20040090613 |
申请日期 |
2004.03.25 |
申请人 |
NATIONAL INSTITUTE FOR MATERIALS SCIENCE |
发明人 |
MITSUI TADASHI;OIKAWA HIDETOSHI;SEKIGUCHI TAKASHI |
分类号 |
G01Q10/04;G01Q60/06;G01Q60/18;G01Q60/22;G01Q60/24;G02B21/06;(IPC1-7):G01N13/14 |
主分类号 |
G01Q10/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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