| 摘要 |
PROBLEM TO BE SOLVED: To provide a parser device, a parser system and a parser method for analyzing a syntax for a test pattern data, in particular, for analyzing a syntax of a test data description language of a mode capable of defining a waveform freely. SOLUTION: This parser system 100 is provided with the parser device 1, a customer data storage device 2, a syntax analysis storage device 3, a simulator 4, a test interface 5, a tester unit 6, a tester limitation inspection device 7, a generator 8 and the like. The parser device 1 syntax-analyzes a customer data in the customer data storage device 2 to be converted to be usable as the test data description language, has a waveform type for defining an event change in a waveform corresponding storage device 16, and converts timing definition into the waveform type, based on information of the waveform type. The tester unit 6 test-processes one portion of a program during development of the program. COPYRIGHT: (C)2006,JPO&NCIPI
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