发明名称 Metal surface inspection device
摘要 A metal surface inspection device which does not perform excessive detection of a harmless flaw, for example, a gloss mark. This task is achieved by providing a first discrimination portion which compares a difference value and a predetermined threshold value for discriminating the presence of a defect on an inspectable surface. This discriminated result is "provisional" and a final discrimination result is obtained by the operation of a second discrimination portion. Here, among the discriminated results of the first discrimination portion, the discrimination duration time corresponding to a harmful flaw is shorter and to the contrary the discrimination duration time corresponding to a harmless flaw is longer. Consequently, the difference between a harmful flaw and a harmless flaw are distinguishable by adjusting a discrimination reference value in the second discrimination portion.
申请公布号 US2005219537(A1) 申请公布日期 2005.10.06
申请号 US20050090008 申请日期 2005.03.28
申请人 FUJI OPTO CO., LTD. 发明人 TANGE HIROSHI;SUZUKI USHIO
分类号 G01N21/892;F16G1/26;G01M13/02;G01N21/55;G01N21/88;G01N21/89;G01N21/95;G01N21/952;(IPC1-7):G01N21/88 主分类号 G01N21/892
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