发明名称 |
Laser production and product qualification via accelerated life testing based on statistical modeling |
摘要 |
A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
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申请公布号 |
US2005218925(A1) |
申请公布日期 |
2005.10.06 |
申请号 |
US20050138602 |
申请日期 |
2005.05.26 |
申请人 |
MIAO SONG;LEI CHUN;CORNELIUS RAJ;KLAJIC ALEX |
发明人 |
MIAO SONG;LEI CHUN;CORNELIUS RAJ;KLAJIC ALEX |
分类号 |
G01R31/26;H01S5/00;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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