| 摘要 |
PROBLEM TO BE SOLVED: To provide a test facilitation circuit designing method with which a scan chain having an equalized length can be easily constructed. SOLUTION: A test facilitation circuit designing method according to the present invention includes the steps of: acquiring the number of scan chains to be constructed, the number of flip-flops for each of a plurality of logic blocks; determining the number of flip-flops which are equal for each scan chain; constructing a scan chain by connecting an input terminal and an output terminal using the equal number of flip-flops selected from one logic block; and constructing a scan chain by connecting an input terminal and an output terminal using the equal number of flip-flops selected from the one logic block and another logic block. COPYRIGHT: (C)2006,JPO&NCIPI
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