| 摘要 |
PROBLEM TO BE SOLVED: To provide a burn-in test system and a burn-in board capable of monitoring test results in a plurality of burn-in patterns. SOLUTION: This burn-in test system is provided with a control circuit 6 for selecting a terminal corresponding to the burn-in pattern out of the plurality of terminals 7α, 7β, 7γof a semiconductor device 5, and for connecting selected terminal electrically to an external terminal 3 of the burn-in board 1, in the burn-in test system for the semiconductor device 5. COPYRIGHT: (C)2006,JPO&NCIPI
|
