发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device includes the steps of: forming a trench in a semiconductor substrate; and forming an epitaxial film on the substrate including a sidewall and a bottom of the trench so that the epitaxial film is filled in the trench. The step of forming the epitaxial film includes a final step before the trench is filled with the epitaxial film. The final step has a forming condition of the epitaxial film in such a manner that the epitaxial film to be formed on the sidewall of the trench has a growth rate at an opening of the trench smaller than a growth rate at a position of the trench, which is deeper than the opening of the trench.
申请公布号 US2005221547(A1) 申请公布日期 2005.10.06
申请号 US20050094782 申请日期 2005.03.31
申请人 SUMITOMO MITSUBISHI SILICON CORPORATION 发明人 YAMAUCHI SHOICHI;YAMAGUCHI HITOSHI;MAKINO TOMOATSU;NOGAMI SYOUJI;YAMAOKA TOMONORI
分类号 H01L29/06;H01L21/20;H01L21/205;H01L21/336;H01L21/338;H01L21/8234;H01L29/78;(IPC1-7):H01L21/338 主分类号 H01L29/06
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