发明名称 Method for noise correction for a flat-panel detector
摘要 For the purpose of noise correction for an x-ray flat-panel detector ( 2 ) it is firstly provided that in the dark image-without radiation impinging on the detector panel ( 4 )-the noise is recorded for the subareas of an active area ( 8 ) and from this, subarea-specific correction factors are determined by means of which the respective signal value of the respective subarea is corrected in imaging operation. A dark area correction factor (DF 1 , DF 2 ) is also determined in each case from the noise of two dark areas ( 6 ) that are spaced apart with respect to each other. In order to determine subarea-specific signal correction factors (SK), each of the DA correction factors (DF 1 , DF 2 ) is weighted with a subarea-specific weighting factor (g 1 , g 2 ), in particular a distance factor (a). By means of said measure improved noise correction is achieved.
申请公布号 US2005219388(A1) 申请公布日期 2005.10.06
申请号 US20050092796 申请日期 2005.03.29
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 HORNIG MATHIAS
分类号 G01T1/29;G03B42/02;H04N5/217;H04N5/32;H04N5/325;H04N5/361;H04N5/365;(IPC1-7):H04N5/217 主分类号 G01T1/29
代理机构 代理人
主权项
地址
您可能感兴趣的专利