INSPECTION METHOD OF LASER LIGHT SOURCE, AND MANUFACTURING METHOD OF LIGHT SOURCE DEVICE

摘要

PROBLEM TO BE SOLVED: To presume the presence or absence of abnormality when a semiconductor laser element and a wavelength selecting reflection filter are built in. SOLUTION: The method inspects a laser light source LS which has the semiconductor laser element and the wavelength selecting reflection filter of a narrow reflection spectral width disposed on the optical axis of projection light of the semiconductor laser element and is used as a light source for a second harmonics generation element 41. Projection light of the laser light source LS is injected to the second harmonics generation element 84, the driving current of the semiconductor laser element is changed, change of light output of the second harmonics projected from the second harmonics generation element 84 is measured and whether or not the laser light source can be used as a light source for the second harmonics generation element 41 is determined based on the change state of light output of the second harmonics to change of the driving current. A light source device is assembled by inspecting the laser light source by the inspection method. COPYRIGHT: (C)2006,JPO&NCIPI