| 摘要 |
A method for the substantially complete detection and measurement of all surface imperfections, within a predetermined size range, contained on the surface of a machined metal component comprising the steps of: a) the accurate positioning of a sample so to expose substantially all of the surface imperfections to be viewed by a high resolution sensor; b) uniformly illuminating the surface of the sample with light; and c) detecting at least one of light scatter, light reflection and light extinction caused by said surface imperfections, with detectors having a depth of focus and field of view of detection over the entire visible surface of the sample. Wherein the detectors are positioned, relative to the sample whereby the optical path and field of view allows the sensor sufficient focus to view substantially all of the samples' surface. The method and apparatus produces a geometric representation of the surface imperfections in the detection region, whereby the size of detected imperfections can be is accurately adjusted to an actual size by either calculation or by calculated offset to allow accurate dimensional measurement of the imperfections.
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