发明名称 Jitter measuring apparatus and a testing apparatus
摘要 A jitter measuring apparatus for measuring jitter of an output signal output by an electronic device is provided, wherein the jitter measuring apparatus includes a multi-strobe generating unit for generating multi-strobe having more than or equal to three ( 3 ) strobes a plurality of times synchronously with the output signal output a plurality of times by the electronic device, a value detecting unit for detecting a value of the output signal for each strobe of the multi-strobe generated a plurality of times by the multi-strobe generating unit, a transition point detecting unit for detecting the position of a transition point of the value of each output signal on the basis of the value of the output signal detected by the value detecting unit, and a histogram generating unit for counting how many times the transition point detecting unit detects the transition point at every position of the transition point of the value of the output signal.
申请公布号 US2005218881(A1) 申请公布日期 2005.10.06
申请号 US20050097102 申请日期 2005.04.01
申请人 ADVANTEST CORPORATION 发明人 TANAKA KOUICHI;NIIJIMA HIROKATSU
分类号 G01R29/02;G01R29/26;G01R31/28;G01R31/317;G01R31/3183;G01R31/319;(IPC1-7):G01R19/00;G01R25/00;H03D13/00 主分类号 G01R29/02
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