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发明名称
半导体装置之制造方法
摘要
一种半导体装置之制造方法,其系包含:在由半导体基板上的元件而形成之凹凸上,形成氧化防止层以防止水分进入元件之第1成膜步骤;在该氧化防止层上,于氧化环境中藉由热处理形成氧化而可膨胀之膨胀层之第2成膜步骤;在该膨胀层上,于氧化环境中藉由热处理形成可流动之绝缘膜之第3成膜步骤;以及使形成有氧化防止层、膨胀层以及绝缘膜之前述半导体基板在氧化环境中进行热处理,在使绝缘膜产生流动化的同时使膨胀层产生氧化膨胀,藉此消灭产生于绝缘膜中的气泡之膨胀步骤。
申请公布号
TW200532745
申请公布日期
2005.10.01
申请号
TW093116383
申请日期
2004.06.08
申请人
石川岛播磨重工业股份有限公司
发明人
渡边智行;芳之内淳
分类号
H01L21/00
主分类号
H01L21/00
代理机构
代理人
洪武雄;陈昭诚
主权项
地址
日本
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