发明名称 Manufacturing method of semiconductor device and semiconductor device
摘要 A manufacturing method of a semiconductor device disclosed herein, comprises: forming a buried insulating film in a semiconductor substrate; forming semiconductor elements isolated by the buried insulating film; cleaning a surface side of the semiconductor substrate with a cleaning solution; and covering a surface side of the buried insulating film with a protective film before the step of cleaning the surface side of the semiconductor substrate, wherein a protective film is resistant to the cleaning solution.
申请公布号 US2005215001(A1) 申请公布日期 2005.09.29
申请号 US20050138163 申请日期 2005.05.25
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OKADA YASUO
分类号 H01L21/28;H01L21/285;H01L21/306;H01L21/336;H01L21/76;H01L21/762;H01L21/768;H01L21/8238;H01L21/8244;H01L27/08;H01L27/092;H01L27/11;H01L29/78;(IPC1-7):H01L21/00;H01L21/823;H01L21/824 主分类号 H01L21/28
代理机构 代理人
主权项
地址