发明名称 Drive circuit and method of applying high voltage test thereon
摘要 A drive circuit that supplies electric power to an electric load from a DC electric source includes a pair of series-connected first and second MOSFETS of the same conduction type, a pair of clamp circuits respectively connected between the drains and gates of the first and second MOSFETS, a series circuit of a first resistor and a switch, a first test terminal; a second test terminal connected to a joint of the first and second MOSFETS, a third test terminal for operating the switch, a fourth test terminal connected a joint of the first resistor and the switch; and a second resistor connected between the gate of the second MOSFET and the first test terminal. The switch and the first resistor are connected between the gate and the source of the first MOSFET to close when the drive circuit is normally operated and to open when it is given a high voltage test.
申请公布号 US2005212568(A1) 申请公布日期 2005.09.29
申请号 US20050063853 申请日期 2005.02.24
申请人 DENSO CORPORATION 发明人 KITAGAWA MASAHIRO;KOJIMA AKIO;NAGATA JUNICHI
分类号 G01R31/28;H03K5/08;H03K5/153;H03K17/08;H03K17/0812;H03K17/082;H03K17/10;H03K17/687;(IPC1-7):H03K5/153 主分类号 G01R31/28
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