| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an image quality control device which enables a change in image-quality control form advantageous in terms of the size, cost, etc. of a substrate. <P>SOLUTION: An image quality control substrate 10 is equipped with a reception circuit 101 for receiving image data 100 which are transmitted from an external device, a first image-pattern detecting circuit 102A for detecting a specific image pattern from the image data 100, an optical power control circuit 103 for controlling optical power of a semiconductor laser 800 depending on each image pattern which is detected by the circuit 102A, and a slot connector 104 for connecting an external extension substrate 1000. The substrate 1000, which is equipped with a second image-pattern detecting circuit 102B, is inserted into the control substrate 10. In this case, the circuit 102A is stopped and separated by a mask signal 106, and the image-quality control can be performed by the circuit 102B. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
