发明名称 SYSTEM AND METHOD FOR EXAMINING MICROORGANISM OR CELL
摘要 PROBLEM TO BE SOLVED: To provide a system for cultivating under plural different conditions without being restricted by the operating temperature range of imaging devices and capable of automatically examining samples without much changing circumstances in examination, and to provide a cultivation method. SOLUTION: The system for examining microorganisms or cells comprises cultivation chambers 11-16 for cultivating samples on trays, an examination chamber 10 for measuring colonies formed by cultivation, and tray carrying devices 41-46, wherein the plural cultivating chambers have a mechanism capable of controlling at least one chamber circumstance condition of temperature, moisture, oxygen concentration or carbon dioxide concentration, and the examination chamber has an image measuring means 61. When circumstance conditions of the plural cultivation chambers are various, circumstances of the examination chamber are adjusted to cultivation circumstances of samples to be examined. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005261260(A) 申请公布日期 2005.09.29
申请号 JP20040076509 申请日期 2004.03.17
申请人 FUJI ELECTRIC HOLDINGS CO LTD 发明人 NODA NAOHIRO;KITADE YUJIRO;KOBAYASHI TAKESHI;ONODERA TAKUYA;ASANO TAKAMASA
分类号 C12M1/34;C12M1/38;C12Q1/04;(IPC1-7):C12M1/34 主分类号 C12M1/34
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